Dr. PC Panchariya, has taken over as the Director of CSIR-Central Electronics Engineering Research Institute (CSIR-CEERI) on 14th July, 2020. Prior to this Dr. Panchariya, Chief Scientist, CSIR-CEERI, was leading CEERI’s Incubation-cum-Innovation Hub, Jaipur as the Scientist In charge and was also the Head of the Signal Analytics Group of the Institute. He also holds the position of professor in the Academy of Scientific and Innovative Research (AcSIR) and has been associated with research and development activities in the field of Intelligent Measurement Systems.

Academic Qualification

Dr. Panchariya did his Masters in Physics (with specialization in Electronics) and Instrumentation Engineering Sciences from Devi Ahilya University, Indore. He continued to work on his Ph.D. at the Institute of Instrumentation, Devi Ahilya University, Indore and Institute of Automation, Bremen University, Germany. Title of his Ph.D. was Artificial Intelligent System Modelling and Identification.

Expertise and Experience in R&D

He specializes in the area of Electronics and Intelligent systems, which includes development of sensors and signal conditioning, measurement systems, process automation, communication systems having applications in dairy, food, tea & sugar manufacturing, mushroom cultivation and coal mines industries.

He has 26 years of long experience in field of instrument design and development. He joined CSIR-CEERI on 31st August, 1994 as Scientist and has been serving as Chief Scientist in the Institute since 2016. He has guided 4 PhD students to their defence and currently guiding 6 PhD students, apart from several under graduate and post-graduate students. He has published several research papers in peer reviewed and other reputed journals and also in international conferences. He also has 7 patents, and a copyright to his credit.

Amongst his many contributions in R&D, the most significant ones are the range of devices developed by him related to milk quality measurement that include Ksheer Scanner & Ksheer Tester (Adulteration Detection System), Milk Fat Tester and Ksheer Analyser. These technologies have been successfully transferred to industries. Ksheer scanner developed by Dr. Panchariya is commercially available and has been installed in more than 1000 dairies.

Ksheer Tester, the handheld System for detection of adulteration in milk was dedicated to the nation by the Hon’ble President of India, Shri Ram Nath Kovind, on the occasion of CSIR Foundation Day, 26th September, 2017 at Vigyan Bhawan. His Ksheer Scanner and Ksheer Tester technologies have been applauded by Hon’ble Prime Minister Sh. Narendra Modi and Hon’ble Minister of S&T Dr. Harsh Vardhan.

Awards and Honors

Dr. Panchariya received DAAD fellowship from the Institute of Automation, University of Bremen, Germany, in the year 2000-2002. He received the best paper award at the World Congress on Lateral Computing, in December 2004, held at Bangalore. He was awarded the prestigious Scotch Gold Award in December, 2017 for developing the Milk Adulteration Detection System.

He is a life member of Vigyan Bharti, Instrument Society of India and Indian Dairy Engineers Association. He is also the fellow of the Institute of Engineers, IETE and the Indian Metrology Society and member of IEEE – Instrumentation and Measurement Society and European Federation of Food Science and Technology.